DISTRETTO TECNOLOGICO SICILIA MICRO E NANO SISTEMI
CdE DTC Lazio
iENTRANCE
ROME TECHNOPOLE
GAMBETTI KENOLOGIA
JEOL
MEDIA SYSTEM LAB
THALES ALENIA SPACE
ZEISS
updated on August 9, 2024
SF.I - Quantum Design
updated on July 19, 2024
SF.I
DRIVEAFM: INNOVATIONS, TRENDS AND FUTURE PERSPECTIVES IN AFM APPLICATION
September 9 -13
Co-organized with:
WS.XV
WORKSHOP
September 11
Quantum Design Italy is pleased to invite you to explore our partner Nanosurf’s flagship AFM, the DriveAFM.
Come to hear about recent advances in AFM technology and learn about the newest state-of-the-art atomic force microscope on the market. DriveAFM is delivered with WaveMode off-resonance photothermally driven excitation, and a fully automated laser alignment on a tip-scanning design, that offers unprecedented possibilities for AFM users in all applications spanning from life science with biological materials such as cells, DNA, viruses, etc. to material science with 2D materials, polymers, photovoltaics, and more.
The workshop will include a live demonstration of the DriveAFM: we offer you the opportunity to bring your own sample of interest to be measured and discussed during the workshop. Please send an email to This email address is being protected from spambots. You need JavaScript enabled to view it. if you would like to make use of this offer.
11:30 - 11:40
Introduction to Quantum Design and Nanosurf
11:40 - 12:00
Short introduction to Atomic Force Microscopy and its applications
12:00-12:20
The Nanosurf DriveAFM, a technical overview Hands-on 1: atomic resolution
12:20-12:40
Photothermal excitation: principle and applications (off-resonance excitation WaveMode) Hands-on 2: soft sample imaged in WaveMode
12:40-13:00
Magnetic Force Microscopy Hands-on 3: MFM measurements
13:00 - 14:00 light lunch
14:00-14:20
Kelvin Probe Force Microscopy Hands-on 4: KPFM measurements
14:20-14:40
Piezoresponse Force Microscopy Hands-on 5: PFM measurements
14:40-15:00
Liquid environments and WaveMode Hands-on 6: measurements in liquid
15:00-15:30
Live demo – Bring your own samples!
Speakers
Héctor CORTE- LÉON Application Scientist at Nanosurf
Marco PORTALUPI Sales Manager Europe at Nanosurf
Stefano PERGOLINI Sales Engineer at Quantum Design Italy
Demo Event II
LIVE DEMO
September 9 - 13
Nanosurf’s DriveAFM live demo – bring your own samples! The DriveAFM, Nanosurf's last generation tip-scanning AFM, will be available throughout the week for live demonstrations: discover the unique capabilities of PhotoThermal excitation (CleanDrive) and WaveMode: book your demo now and bring your samples*! The system empowers researchers with exceptional performance across a diverse range of applications, irrespective of the sample being analyzed. This unique, ultra-low noise architecture provides high-resolution data acquisition, and is compatible with high-fidelity small cantilevers that further boost performance. DriveAFM performs in a stand-alone setup as well as integrated with an inverted optical microscope. A full range of imaging modes are available and the system comes with full motorization that brings automation features that facilitate setting up and performing experiments. The DriveAFM offers a combination of high performance and adaptability for a broad spectrum of applications in materials research and in life science. Its design ensures consistent and reliable operation across both air and liquid environments, and effectively handles large and heavy samples. Beyond basic imaging, the DriveAFM supports the investigation of a sample's electrical and mechanical properties at the nanoscale. It also accommodates a variety of accessories, enhancing its functionality to include temperature control, magnetic field application, electrical current detection, and the ability to observe dynamic changes in electrochemical processes. * Please send an e-mail to This email address is being protected from spambots. You need JavaScript enabled to view it. to book your demo! In order to streamline demos we kindly ask you to limit the number of samples to 1 or 2 and to provide sample description and measurements expectation.