Nano and Metrology 1/2


13 Sept.			09:00 - 10:30



ADVANCED MATERIALS
TT.IX - Technical Multi-Track with Parallel SYMPOSIA
Nano and Metrology 1/2
Co-organized with INRiM Chairs: Natascia DE LEO & Luca BOARINO, INRiM
Advanced Nanomaterials and Nanostructures have unique properties in relation to their reduced dimensionality. These systems are rapidly finding wide use in many Nanotechnology areas, such as Sensors, Energy Conversion & Storage, and Quantum Technologies. The accurate characterization of nanoscale materials by traceable dimensional and analytical techniques is essential for the development and quality control of innovative products. As the structures and the dimensions are ‘nano’ or even at the atomic scale, traditional analytical techniques are being pushed to their limits, requiring new innovative approaches to face state of the art problems leading to international standardisation. The symposium offers a direct view on the nanofabrication and characterisation approaches in Metrology, pre-standardisation and Quantum technologies, thanks to the participation of some of the most active young researchers at INRiM, giving lectures on the state-of-the-art in their respective fields.

TT.IX.A.1	Natascia DE LEO INRiM Opening session
TT.IX.A.2	Federico FERRARESE LUPI - CV INRiM Self-assembling materials for operando metrology of energy storage materials
TT.IX.A.3	Angelo ANGELINI - CV INRiM, PRIN PETALS High-Q Fano Resonances in All-Dielectric Metasurfaces
TT.IX.A.4	Sara NOCENTINI - CV INRiM, PRIN PHOTAG Liquid crystal-based microstructured materials for secure anti-counterfeiting and authentication processes
TT.IX.A.5	Paola TIBERTO - CV INRiM Nanolithographic techniques for the fabrication of 2D and 3D magnetic nanostructures